Performs damage-free ashing of the resist on porous low-k film.

- Low damage ashing by remote plasma method
- High productivity of 160 wafers/h
- Double process chamber
- In combination with ICE/CDE/µASH process chamber
- Many functions (series etching/parallel etching)
- Applicable to 300mm wafers
Equipment specifications
Material
|
Resist on porous low-k |
| Water size |
300mm (200mm) |
| Method |
Downstream |
| Process chambers |
Two chambers |
| Discharge |
Microwave 2.45GHz |
| Transfer mechanism |
Mechanical transfer |
| Wafer temperature |
250-370°C |
| Pressure controls |
APC (Throttle valve) × 2 |
| Vacuum pumps |
Dry pump × 3 |
Process specifications
| Etching rate |
Resist 1.2µm/min |
| Uniformity |
≤ ±7% |
| Δk |
≤ 0.1 |
| Metal contamination |
≤ 1 ×
10E10 atoms/cm² |
| Particles |
≥ 10 pcs/wafer
(≥ 0.16µm) |
Throughput
|
≤ 160
wafers/h |